Browsing by Author "Schmidt, Volker"
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Publication Carrier profiling of a cross-sectioned silicon nanowire by scanning spreading resistance microscopy
Proceedings paper2007, International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology and Modeling, 6/05/2007Publication Characterizing the two-dimensional doping concentration inside silicon-nanowires using scanning spreading resistance microscopy
Proceedings paper2009, Semiconductor Nanowires - Growth,Size-Dependent Properties, and Applications, 13/04/2009, p.1178-AA05-03Publication Controlling the morphology and efficiency of hybrid ZnO:polythiophene solar cells via side chain functionalization