Browsing by Author "Schrimpf, R. D."

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Total ionizing dose effects on strained Ge pMOS FinFETS on bulk Si

Zhang, E. Z
;
Fleetwood, D. M.
;
Hatchel, J. A.
;
Liang, C.
;
Reed, R.
;
Alles, M. L.
;
Schrimpf, R. D.
Journal article
2017, IEEE Transactions on Nuclear Science, (64) 1, p.226-232
Total-dose response of HfO2/Hf-based bipolar resistive memories

Bi, Jinshun
;
Han, Zhengsheng
;
McCurdy, Mike
;
Reed, R. A.
;
Schrimpf, R. D.
;
Fleetwood, D. M.
Proceedings paper
2013-07, Nuclear and Space Radiation Effects Conference - NSREC, 8/07/2013