Browsing by Author "Seifert, W."
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Publication EBIC study of recombination activity of oxygen precipitation related defects in Si
Publication Electrical properties of SiGe epitaxial layers for photovoltaic application as studied by scanning electron microscopical methods
Proceedings paper1998, Beam Injection Assessment of Defects in Semiconductors - BIADS. Proceeding of the 5th International Workshop, 30/08/1998, p.509-518Publication Electrical properties of SiGe layers grown by LPE and CVD
Publication Low-temperature passivation for SiGe-alloy solar cells
Proceedings paper1997, 14th European Photovoltaic Solar Energy Conference and Exhibition. Proceedings of the International Conference, 30/06/1997, p.986-991Publication Recombination activity of oxygen precipitation related defects in Si
Proceedings paper1996, Defect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference, 3/12/1995, p.319-324Publication SiGe thin-film structures for solar cells
Proceedings paper1998, Thin-Film Structures for Photovoltaics, 2/12/1997, p.43-48Publication Study of oxygen related recombination defects in Si by temperature-dependent lifetime and EBIC measurements
Proceedings paper1997, Proceedings of the 7th International Autumn Meeting : Gettering and Defect Engineering in Semiconductor Technology - GADEST '97, 5/10/1997, p.155-160