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Study of oxygen related recombination defects in Si by temperature-dependent lifetime and EBIC measurements
Publication:
Study of oxygen related recombination defects in Si by temperature-dependent lifetime and EBIC measurements
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Date
1997
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gaubas, Eugenijus
;
Vanhellemont, Jan
;
Simoen, Eddy
;
Claeys, Cor
;
Seifert, W.
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1940
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Acq. date: 2025-12-11
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Views
1940
since deposited on 2021-09-30
1
last month
1
last week
Acq. date: 2025-12-11
Citations