Browsing by Author "Selberherr, S."

Now showing 1 - 3 of 3

Electromigration-induced void evolution and failure of Cu/SiCN hybrid bonds

Ceric, H.
;
Zahedmanesh, Houman
;
Croes, Kristof
;
Lacerda de Orio, R.
;
Selberherr, S.
Journal article
2023, JOURNAL OF APPLIED PHYSICS, (133) 10, p.Art. 105101
Investigation of intrinsic stress effects in cantilever structures

Hollauer, Christian
;
Ceric, Hajdn
;
Van Barel, Greg
;
Witvrouw, Ann
;
Selberherr, S.
Proceedings paper
2007, Proceedings of the 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems - NEMS, 16/01/2007, p.151-154
Review-Modeling Methods for Analysis of Electromigration Degradation in Nano-Interconnects

Ceric, H.
;
Selberherr, S.
;
de Orio, R. L.
;
Zahedmanesh, Houman
;
Croes, Kristof
Journal article review
2021, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, (10) 3, p.035003