Browsing by Author "Shie, Bo-Shiuan"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Demonstration of an InGaAs gate stack with sufficient PBTI reliability by thermal budget optimization, nitridation, high-k material choice, and interface dipole
Proceedings paper2016, IEEE Symposium on VLSI Technology, 13/06/2016, p.42-43