Browsing by Author "Shluger, A."

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Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes

Grasser, Tibor
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Waltl, Michael
;
Wimmer, Yannick
;
Goes, Wolfgang
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Kosik, R.
;
Rzepa, Gerhard
Proceedings paper
2015, IEEE International Electron Devices Meeting - IEDM, 7/12/2015, p.535-538
On the volatility of oxide defects: activation, deactivation, and transformation

Grasser, Tibor
;
Waltl, Michael
;
Goes, Wolfgang
;
Wimmer, Yanick
;
El-Sayed, A.-M.
;
Shluger, A.
Proceedings paper
2015, IEEE International Reliability Physics Symposium - IRPS, 19/04/2015, p.5A.3