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Browsing by Author "Shpinar, L. I."

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    Radiation defects and carrier lifetime in tin-doped n-type silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Kraitchinskii, A. M.
    ;
    Kras'ko, M. M.
    ;
    Neimash, V. B.
    ;
    Shpinar, L. I.
    Proceedings paper
    2002, GADEST - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology, 30/09/2001, p.425-430

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