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Radiation defects and carrier lifetime in tin-doped n-type silicon
Publication:
Radiation defects and carrier lifetime in tin-doped n-type silicon
Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Kraitchinskii, A. M.
;
Kras'ko, M. M.
;
Neimash, V. B.
;
Shpinar, L. I.
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1916
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1916
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations