Publication:
Radiation defects and carrier lifetime in tin-doped n-type silicon
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Kraitchinskii, A. M. | |
| dc.contributor.author | Kras'ko, M. M. | |
| dc.contributor.author | Neimash, V. B. | |
| dc.contributor.author | Shpinar, L. I. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T23:11:11Z | |
| dc.date.available | 2021-10-14T23:11:11Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6831 | |
| dc.source.beginpage | 425 | |
| dc.source.conference | GADEST - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology | |
| dc.source.conferencedate | 30/09/2001 | |
| dc.source.conferencelocation | S. Tecla Italy | |
| dc.source.endpage | 430 | |
| dc.title | Radiation defects and carrier lifetime in tin-doped n-type silicon | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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