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Browsing by Author "Shur, Michael"

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    Trap density in Ge-on-Si pMOSFETs with Si intermediate layers

    Fobelets, Kristel
    ;
    Rumyantsev, Sergey
    ;
    Shur, Michael
    ;
    Vincent, Benjamin  
    ;
    Mitard, Jerome  
    Proceedings paper
    2011-06, 21st International Conference on Noise and Fluctuations - ICNF, 12/06/2011, p.317-320

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