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Trap density in Ge-on-Si pMOSFETs with Si intermediate layers
Publication:
Trap density in Ge-on-Si pMOSFETs with Si intermediate layers
Date
2011-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fobelets, Kristel
;
Rumyantsev, Sergey
;
Shur, Michael
;
Vincent, Benjamin
;
Mitard, Jerome
;
De Jaeger, Brice
;
Hoffmann, Thomas Y.
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1884
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1884
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations