Publication:
Trap density in Ge-on-Si pMOSFETs with Si intermediate layers
Date
| dc.contributor.author | Fobelets, Kristel | |
| dc.contributor.author | Rumyantsev, Sergey | |
| dc.contributor.author | Shur, Michael | |
| dc.contributor.author | Vincent, Benjamin | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.author | De Jaeger, Brice | |
| dc.contributor.author | Hoffmann, Thomas Y. | |
| dc.contributor.imecauthor | Vincent, Benjamin | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.imecauthor | De Jaeger, Brice | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
| dc.date.accessioned | 2021-10-19T13:34:17Z | |
| dc.date.available | 2021-10-19T13:34:17Z | |
| dc.date.issued | 2011-06 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18918 | |
| dc.source.beginpage | 317 | |
| dc.source.conference | 21st International Conference on Noise and Fluctuations - ICNF | |
| dc.source.conferencedate | 12/06/2011 | |
| dc.source.conferencelocation | Toronto Canada | |
| dc.source.endpage | 320 | |
| dc.title | Trap density in Ge-on-Si pMOSFETs with Si intermediate layers | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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