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Browsing by Author "Sii, H.K."

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    Hole trap generation in gate dielectric during substrate hole injection

    Zhang, J.F.
    ;
    Sii, H.K.
    ;
    Chen, A.H.
    ;
    Zhao, C.Z.
    ;
    Uren, M.J.
    ;
    Groeseneken, Guido  
    ;
    Degraeve, Robin  
    Journal article
    2004, Semiconductor Science and Technology, (19) 1, p.L1-L3
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    Relation between hole traps and hydrogenous species in silicon dioxides

    Zhang, J.F.
    ;
    Zhao, C.Z.
    ;
    Sii, H.K.
    ;
    Groeseneken, Guido  
    ;
    Degraeve, Robin  
    ;
    Ellis, J.N.
    ;
    Beech, C.D.
    Journal article
    2002, Solid-State Electronics, (46) 11, p.1839-1847

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