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Hole trap generation in gate dielectric during substrate hole injection
Publication:
Hole trap generation in gate dielectric during substrate hole injection
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, J.F.
;
Sii, H.K.
;
Chen, A.H.
;
Zhao, C.Z.
;
Uren, M.J.
;
Groeseneken, Guido
;
Degraeve, Robin
Journal
Semiconductor Science and Technology
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1905
since deposited on 2021-10-15
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Acq. date: 2026-01-07
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Metrics
Views
1905
since deposited on 2021-10-15
2
last month
1
last week
Acq. date: 2026-01-07
Citations