Browsing by Author "Silverans, R. E."

Now showing 1 - 5 of 5

A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs

Watté, J.
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Wuyts, Koen
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Silverans, R. E.
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Van Hove, Marleen
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Van Rossum, Marc
Journal article
1994, Journal of Applied Physics, 75, p.2055-2060
Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures

Wuyts, Koen
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Watté, J.
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Silverans, R. E.
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Van Hove, Marleen
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Borghs, Gustaaf
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Palmstrøm, C. J.
Journal article
1994, Appl. Phys. Lett., 64, p.2406-2408
Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy

Watté, J.
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Provoost, R.
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Silverans, R. E.
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De Wolf, Ingrid
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Maes, Herman
Oral presentation
1995, Annual Meeting of the Belgian Physical Society; May 1995;
Structural and electronic properties of pulsed laser beam mixed Ni/GaAs

Watte, J.
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Silverans, R. E.
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Van Hove, Marleen
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Apetz, R.
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Munder, H.
Proceedings paper
1994, Defect Recognition and Image Processing in Semiconductors and Devices; 5th International Conference on Defect Recognition and Im, p.85-88
The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopy

Watté, J.
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Silverans, R. E.
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Münder, H.
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Palmstrøm, C. J.
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Florez, L. T.
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Van Hove, Marleen
Proceedings paper
1994, Advanced Metallization for Devices and Circuits - Science, Technology and Manufacturing III, 04/04/1994, p.331-337