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Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy
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Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy
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Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Watté, J.
;
Provoost, R.
;
Silverans, R. E.
;
De Wolf, Ingrid
;
Maes, Herman
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Acq. date: 2026-01-25
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Views
2029
since deposited on 2021-09-29
1
last month
Acq. date: 2026-01-25
Citations