Browsing by Author "Singh, Adit"

Now showing 1 - 2 of 2

Adapting to adaptive testing

Marinissen, Erik Jan
;
Singh, Adit
;
Glotter, Dan
;
Esposito, Marco
;
Carulli, John M.
;
Nahar, Amit
Proceedings paper
2010-03, Design, Automation, and Test in Europe Conference - DATE, 9/03/2010, p.556-561
Device aging: A reliability and security concern

Kraak, Daniel
;
Mottaqiallah, Taouil
;
Hamdioui, Said
;
Weckx, Pieter
;
Catthoor, Francky
Proceedings paper
2018, IEEE 23rd European Test Symposium (ETS), 28/05/2018, p.1-10