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Device aging: A reliability and security concern
Publication:
Device aging: A reliability and security concern
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Date
2018
Proceedings Paper
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42042.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kraak, Daniel
;
Mottaqiallah, Taouil
;
Hamdioui, Said
;
Weckx, Pieter
;
Catthoor, Francky
;
Chatterjee, Abhijit
;
Singh, Adit
;
Wunderlich, Joachim
;
Karimi, Naghmeh
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Acq. date: 2025-12-13
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Views
1873
since deposited on 2021-10-25
1
last month
1
last week
Acq. date: 2025-12-13
Citations