Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Device aging: A reliability and security concern
Publication:
Device aging: A reliability and security concern
Date
2018
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
42042.pdf
1.1 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kraak, Daniel
;
Mottaqiallah, Taouil
;
Hamdioui, Said
;
Weckx, Pieter
;
Catthoor, Francky
;
Chatterjee, Abhijit
;
Singh, Adit
;
Wunderlich, Joachim
;
Karimi, Naghmeh
Journal
Abstract
Description
Metrics
Views
1868
since deposited on 2021-10-25
Acq. date: 2025-10-29
Citations
Metrics
Views
1868
since deposited on 2021-10-25
Acq. date: 2025-10-29
Citations