Browsing by Author "Smith, L."
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Publication A systematic study of trade-offs in engineering a locally strained pMOSFET
Proceedings paper2004, Technical Digest International Electron Devices Meeting - IEDM, 13/12/2004, p.1055-1058Publication Copper through silicon via induced keep out zone for 10nm node bulk FinFET CMOS technology
; ; ; Publication Layout impact on the performance of a locally strained PMOSFET
Proceedings paper2005, Symposium on VLSI Technology. Digest of Technical Papers, 14/06/2005, p.22-23