Browsing by Author "Snauwaert, J."
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Publication On the determination of two-dimensional carrier distributions
Proceedings paper1995, 3rd Int. Workshop on the Measurement and Characterizaton of Ultra-Shallow Dopant Profiles in Semiconductors, 20/03/1995, p.41.1-41.19Publication On the determination of two-dimensional carrier distributions
Journal article1995, Nuclear Instruments and Methods in Physics Research B, (96) 1_2, p.123-32Publication One and two-dimensional carrier profiling in semiconductors by nano-SRP
Proceedings paper1995, 3rd Int. Workshop on the Measurement and Characterizaton of Ultra-Shallow Dopant Profiles in Semiconductors, 20/03/1995, p.32.1-32.9Publication One- and two-dimensional carrier profiling in semiconductors by nanospreading resistance profiling
Journal article1996, Journal of Vacuum Science and Technology B, (14) 1, p.380-385Publication Silicon surface roughening by the decomposition of hydrogen peroxide
Proceedings paper1994, Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 15/10/1993, p.102-110Publication Towards a physical understanding of spreading resistance probe profiling
Journal article1994, Journal of Vacuum Science and Technology B, (12) 1, p.304-311