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Articles
One- and two-dimensional carrier profiling in semiconductors by nanospreading resistance profiling
Publication:
One- and two-dimensional carrier profiling in semiconductors by nanospreading resistance profiling
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Peter
;
Clarysse, Trudo
;
Vandervorst, Wilfried
;
Snauwaert, J.
;
Hellemans, L.
Journal
Journal of Vacuum Science and Technology B
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Acq. date: 2026-02-24
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Acq. date: 2026-02-24
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Downloads
2
since deposited on 2021-09-29
Acq. date: 2026-02-24
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1927
since deposited on 2021-09-29
1
last month
Acq. date: 2026-02-24
Citations