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Browsing by Author "Snauwaert, J.J."

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    Electrical characterization of submicrometer silicon devices by cross-sectional contact-mode AFM

    De Wolf, Peter
    ;
    Trenkler, Thomas
    ;
    Clarysse, Trudo
    ;
    Caymax, Matty  
    ;
    Vandervorst, Wilfried  
    Journal article
    1996, Scanning Microscopy, (10) 4, p.937-945

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