Browsing by Author "Snauwaert, Johan"
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Lateral and vertical dopant profiling in semiconductors by atomic force microscopy using conducting tips
Journal article1995, J. Vac. Sci. Technol. A, (13) 3, p.1699-704Publication Minimizing the size of force-controlled point contacts on silicon for carrier profiling
Journal article1996, J. Vacuum Science and Technology B, (B14) 2, p.1513-1517Publication Nanoscale selective silicon nanowires surface functionalization for sensing applications
Meeting abstract2010, MRS Spring Meeting Symposium K: Functional Materials and Nanostructures for Chemical and Biochemical Sensing, 5/11/2010, p.K6.4