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Minimizing the size of force-controlled point contacts on silicon for carrier profiling
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Minimizing the size of force-controlled point contacts on silicon for carrier profiling
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Snauwaert, Johan
;
Blanc, N.
;
De Wolf, Peter
;
Vandervorst, Wilfried
;
Hellemans, L.
Journal
J. Vacuum Science and Technology B
Abstract
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1956
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-13
Citations
Metrics
Views
1956
since deposited on 2021-09-29
2
last month
Acq. date: 2025-12-13
Citations