Browsing by Author "Snoeck, E."

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Experimental and physics-based modeling assessment of strain induced mobility enhancement in FinFETs

Serra, N.
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Conzatti, F.
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Esseni, D.
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De Michielis, M.
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Palestri, P.
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Selmi, L.
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Thomas, S.
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Whall, T. E.
Proceedings paper
2009, IEEE International Electron Devices Meeting - IEDM, 7/12/2009, p.71-74
Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography

Hue, Florent
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Houdellier, F.
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Snoeck, E.
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Hartmann, J.P.
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Destefanis, V.
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Bender, Hugo
Proceedings paper
2008-09, 14th European Microscopy Congress, 1/09/2008, p.123-124
Strain measurements in transistors by dark-field holography

Hue, Florent
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Houdellier, F.
;
Bender, Hugo
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Snoeck, E.
;
Hytch, M.J.
Oral presentation
2009, Microscopy of Semiconducting Materials MSM XVI