Browsing by Author "Sonnenberg, V."
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Publication Analysis of the silicon film thickness and the ground plane influence on ultra thin buried oxide SOI nMOSFETs
Proceedings paper2012, Proceedings of the 27th Symposium on Microelectronics Technology and Devices - SBMicro, 30/08/2012, p.511-517Publication Extraction of the interface and oxide charge density in silicon-on-insulator MOSFETs
Proceedings paper1996, Proceedings of the 7th International Symposium on Silicon-on-Insulator Technology and Devices, 5/05/1996, p.309-317Publication Fin pitch impact on biaxial/uniaxial strain engineering of triple-gate devices
Proceedings paper2011, Advanced Semiconductor-on-Insulator Technology and Related Physics 15, 1/05/2011, p.151-156Publication Subthreshold region analysis for UTBOX and UTBB SOI nMOSFETs with different channel lengths and silicon thickness
Proceedings paper2017, 32nd Symposium on Microelectronics Technology and Devices - SBMicro, 28/08/2017, p.1-4