Publication:
Analysis of the silicon film thickness and the ground plane influence on ultra thin buried oxide SOI nMOSFETs
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1867 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-08
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Metrics
Views
1867 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-08
Citations