Browsing by Author "Spessot, A."
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Publication Analysis of depth-inhomogeneous strains in deep sub-micron silicon devices by TEM/CBED
;Spessot, A. ;Armigliato, A. ;Balboni, R. ;Frabboni, S.Benedetti, AlessandroProceedings paper2005, Proceedings 7th Multinational Congress on Microscopy, 26/06/2005, p.157-158