Browsing by Author "Srinivasan, P."
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication 1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Journal article2009, IEEE Transactions on Device and Materials Reliability, (9) 2, p.180-189Publication l/f Noise performance of n-MOSFETs with Hf-based gate dielectrics
Proceedings paper2005, Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS: New Materials, Processes and Equipment, 16/05/2005, p.151-160