Browsing by Author "Stadalnikas, A."

Now showing 1 - 3 of 3

High frequency RTS noise in submicron MOSFETs

Sikula, J.
;
Hruska, P.
;
Vasina, Petr
;
Claeys, Cor
;
Simoen, Eddy
;
Matulionis, A.
;
Stadalnikas, A.
Proceedings paper
1996, Proceedings 3rd ELEN Workshop, 5/11/1996, p.144-149
Noise and THI reliability indicators for thin film resistors

Sikula, J.
;
Hruska, P.
;
Vasina, Petr
;
Schauer, P.
;
Kolarova, R.
;
Hajek, K.
;
Stadalnikas, A.
Proceedings paper
1996, Proceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium, 7/10/1996, p.200-205
RTS noise in submicron MOSFETs

Sikula, J.
;
Hruska, P.
;
Vasina, Petr
;
Claeys, C.
;
Simoen, Eddy
;
Stadalnikas, A.
Oral presentation
1996, 20th Workshop; May 19-22, 1996; Vilnius, Lithuania.