Browsing by Author "Stadler, Wolfgang"
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Publication A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains
Publication HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform
Publication SCCF - System to component level correlation factor
Proceedings paper2010, 32nd Annual EOS/ESD Symposium, 3/10/2010, p.157-166Publication System to component level correlation factor
Oral presentation2010, International ESD Workshop - IEWPublication Test circuits for fast and reliable assessment of CDM robustness of I/O stages