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A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains
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A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gieser, Horst A.
;
Wolf, Heinrich
;
Soldner, Wolfgang
;
Reichl, Herbert
;
Andreini, Antonio
;
Mahadeva Iyer, Natarajan
;
Stadler, Wolfgang
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1978
since deposited on 2021-10-15
Acq. date: 2026-07-18
Citations
Statistics
Views
1978
since deposited on 2021-10-15
Acq. date: 2026-07-18
Citations