A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains

dc.contributor.author	Gieser, Horst A.
dc.contributor.author	Wolf, Heinrich
dc.contributor.author	Soldner, Wolfgang
dc.contributor.author	Reichl, Herbert
dc.contributor.author	Andreini, Antonio
dc.contributor.author	Mahadeva Iyer, Natarajan
dc.contributor.author	Stadler, Wolfgang
dc.date.accessioned	2021-10-15T04:47:17Z
dc.date.available	2021-10-15T04:47:17Z
dc.date.issued	2003-09
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/7610
dc.source.beginpage	328
dc.source.conference	EOS/ESD Symposium
dc.source.conferencedate	21/09/2003
dc.source.conferencelocation	Las Vegas USA
dc.source.endpage	337
dc.title	A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains
dc.type	Proceedings paper
dspace.entity.type	Publication
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