Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Stals, Lambert"

Filter results by typing the first few letters
Now showing 1 - 4 of 4
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics

    De Schepper, Luc
    ;
    De Ceuninck, Ward  
    ;
    Lekens, Geert  
    ;
    Stals, Lambert
    ;
    Vanhecke, Bruno
    ;
    Roggen, Jean
    Journal article
    1994, Quality and Reliability Engineering International, (10) 1, p.15-26
  • Loading...
    Thumbnail Image
    Publication

    Electrical characterisation and reliability studies of thick film gas sensor structures

    Czech, Ingrid
    ;
    Manca, Jean
    ;
    Roggen, Jean
    ;
    Huyberechts, Guido
    ;
    Stals, Lambert
    ;
    De Schepper, Luc
    Proceedings paper
    1996, IEEE International Conference on Microelectronic Test Structures - ICMTS, 26/03/1996, p.99-103
  • Loading...
    Thumbnail Image
    Publication

    Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy

    Bijnens, W.
    ;
    De Wolf, Ingrid  
    ;
    Manca, Jean
    ;
    D'Haen, Jan  
    ;
    Wu, Ting-Di
    ;
    D'Olieslaeger, Marc  
    ;
    Beyne, Eric  
    Journal article
    1998, Synthetic Metals, (96) 2, p.87-96
  • Loading...
    Thumbnail Image
    Publication

    On the deposition and characterisation of thin SnO2 films

    Czech, Ingrid
    ;
    Roggen, Jean
    ;
    De Schepper, Luc
    ;
    Huyberechts, Guido
    ;
    Stals, Lambert
    Journal article
    1996, Le Vide Science, Technique et Applications, 279, p.131-133

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings