Browsing by Author "Stals, Lambert"
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Publication Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
Journal article1994, Quality and Reliability Engineering International, (10) 1, p.15-26Publication Electrical characterisation and reliability studies of thick film gas sensor structures
;Czech, Ingrid ;Manca, Jean ;Roggen, Jean ;Huyberechts, Guido ;Stals, LambertDe Schepper, LucProceedings paper1996, IEEE International Conference on Microelectronic Test Structures - ICMTS, 26/03/1996, p.99-103Publication Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy
;Bijnens, W.; ;Manca, Jean; ;Wu, Ting-Di; Journal article1998, Synthetic Metals, (96) 2, p.87-96Publication On the deposition and characterisation of thin SnO2 films
;Czech, Ingrid ;Roggen, Jean ;De Schepper, Luc ;Huyberechts, GuidoStals, LambertJournal article1996, Le Vide Science, Technique et Applications, 279, p.131-133