Browsing by Author "Stampfer, Bernhard"
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Publication Extraction of statistical gate oxide parameters from large MOSFET arrrays
Journal article2020, IEEE Transactions on Device and Materials Reliability, (20) 2, p.251-257Publication Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?
Publication Separation of electron and hole trapping components of PBTI in SiON nMOS transistors
Journal article2020, Microelectronics Reliability, 114, p.113746Publication Statistical characterization of BTI and RTN using pMOS arrays
Proceedings paper2019, IEEE International Integrated Reliability Workshop (IIRW), 13/10/2019