Publication:
Separation of electron and hole trapping components of PBTI in SiON nMOS transistors
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1855 since deposited on 2021-10-29
2last month
Acq. date: 2026-02-27
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Statistics
Views
1855 since deposited on 2021-10-29
2last month
Acq. date: 2026-02-27
Citations