Browsing by Author "Stangl, J."
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Publication Study of the relaxation of strain in patterned Si/SiGe structures using an x-ray diffraction technique
;Rehman Khan, Aaliya ;Stangl, J. ;Bauer, G. ;Buca, D. ;Holländer, B. ;Trinkhaus, H.Mantl, S.Journal article2007, Semiconductor Science and Technology, (22) 1, p.S212-S215