Browsing by Author "Strangio, Sebastiano"
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Publication Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability
Proceedings paper2013, International Reliability Physics Symposium - IRPS, 14/04/2013, p.5E.3Publication On the bipolar resistive-switching characteristics of Al2O3- and HfO2-based memory cells operated in the soft-breakdown regime
Journal article2014, Journal of Applied Physics, (116) 13, p.134502Publication Single defect discharge events in vertical-nanowire tunnel-FETs
Journal article2017, IEEE Transactions on Device and Materials Reliability, (17) 1, p.253-258Publication Understanding the intrinsic characteristics and memory trade-offs of sub-μA filamentary RRAM operation
Proceedings paper2013, VLSI Technology Symposium, 11/06/2013, p.162-163