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Browsing by Author "Sueoka, K."

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    A comparison of intrinsic point defect properties in Si and Ge

    Vanhellemont, J.
    ;
    Spiewak, P.
    ;
    Sueoka, K.
    ;
    Simoen, Eddy  
    ;
    Romandic, I.
    Proceedings paper
    2008, Doping Engineering for Front-End Processing, 24/03/2008, p.1070-E6-05

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