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Browsing by Author "Sun, L."

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    Characterization of high-k dielectrics by combined spectroscopic ellipsometry (SE) and x-ray reflectometry (XRR)

    Sun, L.
    ;
    Defranoux, C.
    ;
    Stehlé, J.L.
    ;
    Boher, P.
    ;
    Evrard, P.
    ;
    Bellandi, E.
    ;
    Bender, Hugo  
    Proceedings paper
    2004, Fundamentals of Novel Oxide/Semiconductor Interfaces, 1/12/2003, p.95-101

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