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Browsing by Author "Sun, Lianchao"

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    High-k dielectric characterization by combined VUV spectroscopic ellipsometry and X-ray reflectometry

    Boher, P.
    ;
    Evrard, P.
    ;
    Defranoux, C.
    ;
    Darragon, A.
    ;
    Sun, Lianchao
    ;
    Fouere, J.C.
    ;
    Stehlé, J.L.
    Proceedings paper
    2003-12, MRS Fall Meeting Symposium E: Fundamentals of Novel Oxide/Semiconductor Interfaces, 1/12/2003

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