Browsing by Author "Sun, Lianchao"
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Publication High-k dielectric characterization by combined VUV spectroscopic ellipsometry and X-ray reflectometry
;Boher, P. ;Evrard, P. ;Defranoux, C. ;Darragon, A. ;Sun, Lianchao ;Fouere, J.C.Stehlé, J.L.Proceedings paper2003-12, MRS Fall Meeting Symposium E: Fundamentals of Novel Oxide/Semiconductor Interfaces, 1/12/2003