Browsing by Author "Tack, M."
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Publication A comprehensive model for hot carrier degradation in LDMOS transistors
Proceedings paper2007, Proceedings 45th Annual IEEE International Reliability Physics Symposium, 15/04/2007, p.492-497Publication A high voltage p-type drain extended MOS in a low voltage sub-micron CMOS technology
Proceedings paper1998, Proceedings of the 28th European Solid-State Device Research Conference - ESSDERC, 8/09/1998, p.492-495Publication Dynamic-ron control via proton irradiation in AlGaN/GaN transistors
Proceedings paper2018, 30th International Symposium on Power Semiconductor Devices & ICs - ISPSD, 13/05/2018, p.92-95Publication Future trends in intelligent interface technologies for 42V battery automotive applications
Publication Stress-induced mobility enhancement for integrated power transistors
Proceedings paper2007, Technical Digest International Electron Devices Meeting - IEDM, 10/12/2007, p.877-880Publication μ-Raman validated stress-enhanced mobility in XtreMOS transistors
Proceedings paper2008, 20th International Symposium on Power Semiconductor Devices and IC's - ISPSD, 18/05/2008, p.84-87