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Browsing by Author "Tahoori, Mehdi B."

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    Dynamic Segmented Bus for Energy-Efficient Last-Level Cache in Advanced Interconnect-Dominant Nodes

    Mayahinia, Mahta
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    Marinelli, Tommaso
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    Pei, Zhenlin
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    Liu, Hsiao-Hsuan
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    Pan, Chenyun
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    Tokei, Zsolt  
    Journal article
    2024, IEEE EMBEDDED SYSTEMS LETTERS, (16) 4, p.321-324
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    Hard Error Correction in STT-MRAM

    Hemaram, Surendra
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    Tahoori, Mehdi B.
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    Catthoor, Francky  
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    Rao, Siddharth  
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    Couet, Sebastien  
    Proceedings paper
    2024, 29th Asia and South Pacific Design Automation Conference (ASP-DAC), JAN 22-25, 2024, p.752-757
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    High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors

    Nair, Sarath Mohanachandran
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    Mayahinia, Mahta
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    Tahoori, Mehdi B.
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    Perumkunnil, Manu  
    Journal article
    2021, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (21) 2, p.258-266
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    Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects

    Nair, Sarath Mohanachandran
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    Bishnoi, Rajendra
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    Tahoori, Mehdi B.
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    Zahedmanesh, Houman  
    Proceedings paper
    2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020
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    Soft and Hard Error-Correction Techniques in STT-MRAM

    Hemaram, Surendra
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    Tahoori, Mehdi B.
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    Catthoor, Francky  
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    Rao, Siddharth  
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    Couet, Sebastien  
    Journal article
    2024, IEEE DESIGN & TEST, (41) 5, p.65-82
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    Special Session: STT-MRAMs: Technology, Design and Test

    Gebregiorgis, Anteneh
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    Wu, Lizhou
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    Muench, Christopher
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    Rao, Siddharth  
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    Tahoori, Mehdi B.
    Proceedings paper
    2022-06-15, 40th IEEE VLSI Test Symposium (VTS), APR 25-27, 2022
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    Ultra-Scaled E-Tree-Based SRAM Design and Optimization With Interconnect Focus

    Pei, Zhenlin
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    Liu, Hsiao-Hsuan
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    Mayahinia, Mahta
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    Tahoori, Mehdi B.
    ;
    Catthoor, Francky  
    Journal article
    2024, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, (71) 10, p.4597-4610

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