Publication:

Special Session: STT-MRAMs: Technology, Design and Test

Date

2022-06-15
Proceedings Paper
https://doi.org/10.1109/VTS52500.2021.9794278
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Published version 4.9 MB

Author(s)

Gebregiorgis, Anteneh
;
Wu, Lizhou
;
Muench, Christopher
;
Rao, Siddharth  
;
Tahoori, Mehdi B.
;
Hamdioui, Said

Journal

2022 IEEE 40th VLSI Test Symposium (VTS)

Abstract

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1437 since deposited on 2022-09-16
Acq. date: 2026-01-05

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1437 since deposited on 2022-09-16
Acq. date: 2026-01-05

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