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Special Session: STT-MRAMs: Technology, Design and Test
Publication:
Special Session: STT-MRAMs: Technology, Design and Test
Date
2022-06-15
Proceedings Paper
https://doi.org/10.1109/VTS52500.2021.9794278
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4.9 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gebregiorgis, Anteneh
;
Wu, Lizhou
;
Muench, Christopher
;
Rao, Siddharth
;
Tahoori, Mehdi B.
;
Hamdioui, Said
Journal
2022 IEEE 40th VLSI Test Symposium (VTS)
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1435
since deposited on 2022-09-16
Acq. date: 2025-10-24
Citations
Metrics
Views
1435
since deposited on 2022-09-16
Acq. date: 2025-10-24
Citations