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Browsing by Author "Takami., Y."

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    Radiation damage of N-MOSFETS fabricated in a BiCMOS process

    Kobayashi, K.
    ;
    Ohyama, Hidenori
    ;
    Yoneoka, M.
    ;
    Hayama, Kiyoteru
    ;
    Nakabayashi, M.
    ;
    Simoen, Eddy  
    Journal article
    2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.227-230

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