Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Publication:
Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Date
2001
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kobayashi, K.
;
Ohyama, Hidenori
;
Yoneoka, M.
;
Hayama, Kiyoteru
;
Nakabayashi, M.
;
Simoen, Eddy
;
Claeys, Cor
;
Takami., Y.
;
Takizawa, H.
;
Kohiki, S.
Journal
Journal of Materials Science: Materials in Electronics
Abstract
Description
Metrics
Views
2017
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
2017
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations