Publication:

Radiation damage of N-MOSFETS fabricated in a BiCMOS process

Date

2001
Journal article
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Author(s)

Kobayashi, K.
;
Ohyama, Hidenori
;
Yoneoka, M.
;
Hayama, Kiyoteru
;
Nakabayashi, M.
;
Simoen, Eddy  
;
Claeys, Cor
;
Takami., Y.
;
Takizawa, H.
;
Kohiki, S.

Journal

Journal of Materials Science: Materials in Electronics

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2024 since deposited on 2021-10-14
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