Publication:

Radiation damage of N-MOSFETS fabricated in a BiCMOS process

Date

2001

Journal article

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Author(s)

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Ohyama, Hidenori

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Hayama, Kiyoteru

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Nakabayashi, M.

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Journal

Journal of Materials Science: Materials in Electronics

Statistics

2020 since deposited on 2021-10-14

1last month

Acq. date: 2026-01-26