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Browsing by Author "Takamure, N"

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    Integration of porogen-based low-k films: influence of capping layer thickness and long thermal anneals on low-k damage and reliability

    De Roest, David  
    ;
    Vereecke, Bart  
    ;
    Huffman, Craig
    ;
    Heylen, Nancy  
    ;
    Croes, Kristof  
    ;
    Arai, H
    ;
    Takamure, N
    Meeting abstract
    2009, Advanced Metallization Conference, 13/10/2009

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