Publication:

Integration of porogen-based low-k films: influence of capping layer thickness and long thermal anneals on low-k damage and reliability

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1929 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-03-16

Citations

Statistics

Views

1929 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2026-03-16

Citations