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Browsing by Author "Takenaka, Hiroshi"

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    FI-CDM and LICCDM testing on wafer, single die and package levels

    Simicic, Marko  
    ;
    Takenaka, Hiroshi
    ;
    Tamura, Shinichi
    ;
    Claes, Dieter  
    ;
    Shimada, Yohei
    Proceedings paper
    2024, 46th Annual Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), SEP 16-18, 2024

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